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SpotLight
- SpectrumOne
Chemical
Imaging (FT-IR)
Perkin-Elmer
The
Spectrum Spotlight 350 combines state-of-the art imaging technology and
full automation, maximizing productivity and accelerating problem
solving. The Near-IR spectral range is particularly convenient for
rapid sample imaging since measurements since sample preparation is
often unnecessary. Spectra are collected directly from the sample
surface at a pixel size of either 6.25 x 6.25 um or 25 x 25 um over a
user-definable sampling area. Samples are simply stepped below a linear
detector array, building an image at a rate of up to 80 pixels per
second - for example at 25 x 25 um pixel size, a 1 x 1 mm sample area
can be imaged in less than 1 minute and a 5 x 5 mm sample area in
around 7 minutes. Each pixel corresponds to a high-quality NIR spectrum
and by using Spotlight’s built-in intelligent software
routines, chemical differences between pixels are highlighted images
that show the distribution of individual ingredients are quickly
displayed.
- Seamless
automation simplifies set-up and measurement, increasing productivity
and reducing errors
- Two-in-one
detector enables single-point microscopy as well as IR Imaging,
allowing micro-contaminants in products and packaging to be identified
in seconds
- Powerful
built-in data processing routines automate data analysis and provide
quick answers
- Superb
visible image quality ensures accurate and easy sample inspection
- User-defined
sampling area and aspect ratio allows you to match the image size to
the sample size.
- Full
range imaging from 7800 – 2200 cm-1 covers the most
information-rich areas of the spectrum, maximising applications
flexibility
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HPLC
High Performance Liquid Chromatography
Perkin-Elmer
The chromatograph is constituted of a Perkin-Elmer 410 LC pump, a
NUCLEOSIL® 100-5 C18 Nautilus 25 cm long column containing a
not polar stationary phase and of a UV Perkin-Elmer detector.
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DSC
Thermal Analysis
TGA
Thermogravimetrical Analysis
Perkin-Elmer
The Perkin-Elmer DSC-7 differential scanning calorimeter is used to
measure melting points, glass transitions, and heats of fusion. Typical
temperature range is from 10° C to 400° C. The
temperature scale is calibrated using a two-point calibration,
measuring the onset temperatures of indium and zinc standards. The
enthalpy scale is calibrated using the observed delta-H from an
accurately known amount of indium. Samples are encapsulated in
disposable aluminum pans, typically using 3 - 10 milligrams of sample.
There are two styles of pan available, one used for solids, and a
hermetically sealed version for liquids. Data acquisition and
processing is done with Perkin-Elmer's Pyris software. From graphs of
heat flow versus temperature, one can calculate onset temperatures,
peak areas, enthalpies and glass transitions.
A thermal analyser Perkin-Elmer TGA‑6 was used for the
thermogravimetric analysis under nitrogen flow. |
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AFM
Atomic Force Microscopy
The AFM works by scanning a fine ceramic or semiconductor tip over a
surface much the same way as a phonograph needle scans a record (for
those of you that remember what a record player was!). The tip is
positioned at the end of a cantilever beam shaped much like a diving
board. As the tip is repelled by or attracted to the surface, the
cantilever beam deflects. The magnitude of the deflection is captured
by a laser that reflects at an oblique angle from the very end of the
cantilever. A plot of the laser deflection versus tip position on the
sample surface provides the resolution of the hills and valleys that
constitute the topography of the surface.
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SEM
Scanning Electon Microscopy
JEOL JSM 5600
Scanning electron microscopy (SEM) is a method for high-resolution
imaging of surfaces. The SEM is an instrument operating under high
vacuum degree; it uses electrons for imaging, much as a light
microscope uses visible light. The advantages of SEM over light
microscopy include greater magnification (up to 100,000X) and much
greater depth of field.
An incident electron beam is raster-scanned across the sample's
surface, and the resulting electrons emitted from the sample are
collected to form an image of the surface.
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INSTRON
Instron's 5540 Series materials testing systems feature a single column
design requiring minimal bench space. The Model 5542 provides accurate
and reliable operation for many testing applications. This versatile
tabletop system performs tensile, compression, shear, peel, tear,
friction, flexural, and other tests on a wide variety of materials for
the medical industry. |
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UV
Spectrophotometer
Complete double beam spectrophotometer with holographic grating for
wavelength range 190 - 900 nm;
Resolution 0.1 nm;
Photometric system is Double-beam system;
Spectra band width selectable from 0.1 to 5 nm;
Photometric
range:
- Absorbance
-4 to 5 ABS;
- Transmittance
0 to 999.9%T.
Photometric accuracy:
- +
0.002 ABS at 0 to 0.5 ABS;
- +
0.004 ABS at 0.5 to 1.0 ABS;
- +
0.3%T.
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PLASMA
Junior Plasma System
EUROPLASMA
This low cost laboratory plasma system is a step-in model for specific
plasma processes as activation, etching, photo resist stripping and
cleaning of small parts and laboratory samples.
The unique tool for plasma development, proto type treatment and small
production runs and laboratory use.
Applications:
- Grafting;
- Activation;
- Plasma deposition.
- Chamber
size:
Ø 200 mm/ L 200 mm;
- Standard
microwave, other frequency on request;
- Complete
working top-table model.
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Extruder
Æ12/20D VSF
MAC.GI
Microextruders projected to solve problems as regards microproduction
of medicines and biopolymers.
Screw
diameter mm
Screw length L/D
Screw speed rpm
Bearing axial dynamic load daN |
12
20
100
2800 |
N°
of barrel heating
zones
Power of barrel heating zone W
Max. working temperature °C
Max. working pressure BAR |
3
450
400
500 |
| Horizontal
and vertical
Hopper capacity, litres |
3
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N°
of cooling zones
of the feeding zone
Type of cooling
Water comsumption m3/h |
2
water
~0.1 |
Motor
type
Motor KW
N° of revolution rpm
Power of motor fan W
Encoder type |
asynchronous
1.1
2000
40
1024 imp/rpm |
Reduction
gear type
Reduction gear ratio I=
Reduction gear nominal torque daNm |
worm
screw
20
10.6 |
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Knife
machine for
MEMBRANE prepararation
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Permeation Test
Apparatus: testing of diffusive and under pressure permeation
properties of dense and porous films
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